News
Reflectance Evaluation
Two optional devices are currently under preparation for measurement and evaluation of
- optical scattering - BRDF,
- hemispherical reflectance with or without specular components.
For BRDF measurement and evaluation a white-light high intensity point source will be available. This device makes alignment of light source, specimen and receiver easy while providing a high directional resolution (FWHM < 1°).
For evaluation of a range of hemispherical reflectance characteristics an integrating sphere will be available for illumination of the display under test with specualr components excluded or included in the measurement.
